Power Module Packaging Analysis
Theory: a layered heat path
Overview
Where should I start in estimating power module die temperature?
Heat from the die escapes through layer after layer to the heatsink: solder under the die, copper traces, insulating ceramic, another copper layer, substrate solder, a thick copper baseplate and thermal grease against the heatsink. Each has thermal resistance; their sum times power gives temperature rise. Heat spreads sideways as it descends, so lower layers have larger areas and less resistance. Start with this 1D stack to see which layers matter, then confirm with 3D thermal analysis.
Layer resistance with heat spreading
a is the side of the square heat-flow area, starting at the 10 mm die and spreading at 45° through each layer (capped at the 60 mm baseplate). Layer area is the geometric mean of inlet and outlet. Stack: SiC die 0.35 mm (370 W/mK), solder 0.1 mm (50), copper 0.3 mm (390), ceramic, copper 0.3 mm, solder 0.1 mm, copper baseplate 3 mm (390), thermal grease 0.1 mm (3).
Thermal-expansion mismatch
Starting from broken wire bonds
Typical life-limiting failures in power modules are aluminium bond wires on the die lifting off at their roots under temperature cycling, and cracks growing in solder beneath the die and substrate. Both arise from strain repeated at each temperature change due to differing thermal expansion. Reliability was studied in detail from the 1990s for railway and industrial use; with EVs and high-temperature SiC operation, sintered-silver bonding and wire-free structures are spreading.
Worked examples
Example 1: ceramic type and thermal resistance (10 mm die, 200 W)
| Layer | Alumina 0.32 mm | AlN 0.635 mm | Si3N4 0.32 mm |
|---|---|---|---|
| SiC die | 0.009 | 0.009 | 0.009 |
| Die solder | 0.017 | 0.017 | 0.017 |
| Ceramic | 0.096 | 0.025 | 0.025 |
| Cu baseplate | 0.031 | 0.029 | 0.031 |
| Thermal grease | 0.092 | 0.086 | 0.092 |
| Junction to case | 0.176 | 0.102 | 0.106 |
| Junction to heatsink | 0.268 | 0.188 | 0.198 |
| Rise at 200 W | 54 K | 38 K | 40 K |
Units K/W (except last row). The two copper layers and substrate solder total about 0.02 K/W and are omitted.
Example 2: copper–ceramic expansion mismatch (100 K)
| Ceramic | CTE | Difference from Cu | Mismatch strain |
|---|---|---|---|
| Alumina | 7 ppm/K | 10 ppm/K | 0.10% |
| AlN | 4.5 ppm/K | 12.5 ppm/K | 0.12% |
| Si3N4 | 3 ppm/K | 14 ppm/K | 0.14% |
Si3N4 has the largest mismatch with copper, so why is it called the most cycling-resistant?
Because what matters is not only the mismatch strain but whether the ceramic survives it. Thermal cycling concentrates stress at the edges of the copper–ceramic interface, cracking the ceramic or peeling the copper. Silicon nitride's fracture toughness is about twice that of alumina or AlN, so it tolerates thick copper, which also spreads heat and lowers resistance further. AlN conducts well but cracks easily and needs about 0.635 mm thickness; as the table shows, thin Si3N4 matches thick AlN thermally. The other key point is the grease, the largest layer here: better substrates and dies won't cool the die if grease is applied thick, so design must include baseplate warpage and grease thickness control.
Analysis workflow
- Estimate each layer's resistance with a 1D stack to find dominant layers.
- Confirm multi-die thermal interaction and spreading with 3D analysis.
- Derive losses from current waveforms and compute die temperature swings with transient thermal impedance.
- Estimate solder and wire life from temperature swing with lifetime models.
- Compare with thermocouple, infrared and thermal-transient measurements.
“Identical modules ran 10 K apart”
In one system, identical power modules side by side showed die temperatures differing by up to about 10 K. Hand-applied grease varied, exceeding 0.2 mm in places. With grease accounting for over 30% of thermal resistance, doubling its thickness markedly raises temperature. Screen-printing the grease to uniform thickness and setting a tightening sequence that accounts for baseplate warpage reduced the spread to about 2 K.
Common mistakes
Mistakes and fixes
| Mistake | Effect | Fix |
|---|---|---|
| Ignoring spreading | Lower-layer resistance overestimated | Account for spreading |
| Omitting grease | Temperature underestimated | Include thickness variation |
| Steady-state only | Temperature swings missed | Transient impedance |
| Choosing substrate on conductivity alone | Cracks under cycling | Consider toughness |
| Ignoring die-to-die coupling | Centre die overheats | Analyse in 3D |
I'd like to learn related topics.
Related pages include power device thermal design, parasitic inductance, high-voltage insulation design, gate driver design and busbar design.
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