Reduced Order Model (ROM) for Coupled Problems
Theory: representing response with a few time constants
Overview
If a ROM loses accuracy, why use it in coupled analysis?
Because in coupling, speed matters as much as accuracy. An inverter circuit simulation, for example, takes hundreds of thousands of fine time steps to follow switching, and at each step semiconductor temperature must be found and temperature-dependent loss fed back. Dropping a detailed finite-element thermal model in directly never finishes. So a ROM reproduces only the input (heat) to output (temperature) relationship with few variables. Heat conduction is linear and its response is usually set by a few time constants, so a well-built ROM with a handful of variables matches the full model closely. What matters is checking the range over which it is valid.
Reduction to a Foster network
The full model stacks 0.3 mm silicon, 0.1 mm solder, 3 mm copper, 0.1 mm thermal grease and 20 mm aluminium over 1 cm², cooled at the bottom with 2,000 W/m²K — a 1D model with 200 DOF, 6.45 K/W thermal resistance and slowest time constant 32.1 s. Three terms were fitted to its step response.
Coupling with temperature-dependent loss
P₀ = 10 W, ambient 25 °C. Loss rises 0.6% per kelvin (representing on-resistance temperature dependence).
Foster and Cauer
Representing a given response with networks of resistors, capacitors and the like grew out of 1920s telephone-circuit research. Foster in 1924 and Cauer in 1926 presented different network forms. The Foster network expresses response as a sum of exponentials and is easy to fit; the Cauer ladder maps naturally to layer stacks. Century-old telephone theory is now used daily for thermal ROMs of power semiconductors.
Worked examples
Example 1: fitting a three-stage Foster network
| Stage | Thermal resistance | Time constant | Mainly represents |
|---|---|---|---|
| 1 | 0.061 K/W | 0.0029 s | Die and solder |
| 2 | 0.446 K/W | 0.68 s | Copper base and grease |
| 3 | 5.943 K/W | 32.1 s | Heatsink and cooling |
| Time | Full model | ROM |
|---|---|---|
| 0.01 s | 0.060 K/W | 0.067 K/W |
| 0.1 s | 0.146 K/W | 0.140 K/W |
| 1 s | 0.580 K/W | 0.587 K/W |
| 10 s | 2.101 K/W | 2.098 K/W |
| 100 s | 6.185 K/W | 6.186 K/W |
Overall maximum fit error is 0.008 K/W (0.1% of thermal resistance), but at 0.01 s the relative error exceeds 10%.
Example 2: electro-thermal coupled run
| Case | Full (200 DOF) | ROM (3 states) |
|---|---|---|
| 5 s on / 5 s off for 300 s, peak | 71.79℃ | 71.76℃ |
| Continuous, steady (coupled) | 130.2℃ | 130.2℃ |
| Continuous, steady (constant loss) | 89.5℃ | 89.5℃ |
Coupling raises steady temperature from 89.5 to 130.2 °C. With loss rising only 0.6% per K, why so different?
Because of positive feedback: higher temperature raises loss, which raises temperature further. With constant loss the rise is thermal resistance × loss = 64.5 K; with coupling it becomes 64.5/(1 − 0.006×64.5) = 105 K. As the 0.39 in the denominator approaches 1, temperature climbs steeply, and at 1 it never settles (thermal runaway). Constant-loss thermal calculations therefore underestimate risk in electro-thermal problems. This is exactly where ROMs help: exchanging temperature and loss every step inside a circuit simulation adds almost no run time. But a ROM assumes linear conduction, so if conductivity changes strongly with temperature or cooling conditions change, verify with the full model or rebuild the ROM per condition.
Modelling workflow
- Compute step responses for each heat source with the detailed thermal model.
- Fit sums of exponentials and confirm the time-constant range covers the application time scales.
- With several heat sources, include mutual influence (mutual thermal impedance).
- Embed in the circuit simulation and exchange temperature and loss.
- Check against the full model for representative cases.
“A prediction that missed on short pulses”
In a motor drive, ROM-predicted die temperature during millisecond high-current motor starts came out nearly 10 K below measurement. The ROM had been fitted to second-scale response, its shortest time constant longer than a few milliseconds, so it couldn't capture rapid heating within the die. Rebuilding with two additional short-time-constant terms brought start-up temperatures into agreement with measurement.
Common mistakes
Mistakes and fixes
| Mistake | Effect | Fix |
|---|---|---|
| Fitting long times only | Short-pulse temperature wrong | Fit over application time range |
| Constant loss | Temperature underestimated | Couple with temperature |
| Single heat source only | Neighbour heating missed | Include mutual impedance |
| Reusing ROM after cooling change | Time constants mismatch | Rebuild per condition |
| Using Foster node temperatures | No physical meaning | Use input–output only |
I'd like to learn related topics.
Related pages include model order reduction (POD), digital twin, convergence of coupled analysis, data-driven multiphysics and co-simulation coupling.
Related Topics
Experience the theory firsthand with the interactive simulator for this field
All Simulators