Test Setup
Test Type
Alternative Hypothesis
Significance Level α
Sample 1
Sample Mean x̄₁
Sample Std Dev s (or σ)
Sample Size n₁
Null Hypothesis Mean μ₀
Sample 2
Sample Mean x̄₂
Sample Std Dev s₂
Sample Size n₂
—
Test Statistic t
—
p-value
—
Critical Value
—
Deg. of Freedom df
—
Cohen's d
Distribution with Critical Region
Theory
One-sample z-test: $z = \dfrac{\bar{x} - \mu_0}{\sigma / \sqrt{n}}$
One-sample t-test: $t = \dfrac{\bar{x} - \mu_0}{s / \sqrt{n}}$, degrees of freedom $df = n-1$
Two-sample t-test: $t = \dfrac{\bar{x}_1 - \bar{x}_2}{s_p\sqrt{1/n_1+1/n_2}}$, $s_p^2 = \dfrac{(n_1-1)s_1^2+(n_2-1)s_2^2}{n_1+n_2-2}$
Effect size: Cohen's $d = \dfrac{|\bar{x} - \mu_0|}{s}$ — small: 0.2, medium: 0.5, large: 0.8
CAE & Quality Control Applications: Statistical hypothesis testing is used to verify significance of material batch differences, compare simulation vs. experimental results, quantify before/after improvement effects, and validate process changes. The two-sample t-test is the standard method for comparing two design variants or manufacturing processes.