Process Capability Cp/Cpk Tool Back EN · ZH
Process Capability

Process Capability Indices Cp/Cpk · Histogram Visualization

Instantly calculate Cp, Cpk, Pp, Ppk, and Cpm from measured data or direct µ/σ input. Visualize defect rate, PPM, and sigma level against USL/LSL.

Data Input
Measurements (up to 100 points, comma or newline separated)
USL (Upper Spec. Limit) 5.50
LSL (Lower Spec. Limit) 4.50
Cp
Cpk
PPM Defects
Sigma Level
Mean µ
Std. Dev. σ
Cpm (Taguchi)
Status (Cpk≥1.33)
Histogram + Normal Distribution Fit
Normal Probability Plot

Process Capability Index Formulas

$$C_p = \frac{USL-LSL}{6\sigma},\quad C_{pk} = \min\!\left(\frac{USL-\mu}{3\sigma},\frac{\mu-LSL}{3\sigma}\right)$$ $$C_{pm} = \frac{USL-LSL}{6\tau},\quad \tau = \sqrt{\sigma^2+(\mu-T)^2}$$

PPM defect rate: $\text{PPM} = \left[1-\Phi\!\left(\frac{USL-\mu}{\sigma}\right)+\Phi\!\left(\frac{LSL-\mu}{\sigma}\right)\right]\times 10^6$

Quality Engineering & Manufacturing Applications: Dimensional tolerance analysis of automotive parts / Process evaluation for injection-molded and stamped parts / Process capability reporting for ISO/IATF 16949 / Data for PPAP (Production Part Approval Process).